| /* |
| * linux/drivers/mtd/onenand/onenand_bbt.c |
| * |
| * Bad Block Table support for the OneNAND driver |
| * |
| * Copyright(c) 2005 Samsung Electronics |
| * Kyungmin Park <kyungmin.park@samsung.com> |
| * |
| * Derived from nand_bbt.c |
| * |
| * TODO: |
| * Split BBT core and chip specific BBT. |
| */ |
| |
| #include <linux/slab.h> |
| #include <linux/mtd/mtd.h> |
| #include <linux/mtd/onenand.h> |
| #include <linux/mtd/compatmac.h> |
| |
| extern int onenand_do_read_oob(struct mtd_info *mtd, loff_t from, size_t len, |
| size_t *retlen, u_char *buf); |
| |
| /** |
| * check_short_pattern - [GENERIC] check if a pattern is in the buffer |
| * @param buf the buffer to search |
| * @param len the length of buffer to search |
| * @param paglen the pagelength |
| * @param td search pattern descriptor |
| * |
| * Check for a pattern at the given place. Used to search bad block |
| * tables and good / bad block identifiers. Same as check_pattern, but |
| * no optional empty check and the pattern is expected to start |
| * at offset 0. |
| * |
| */ |
| static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td) |
| { |
| int i; |
| uint8_t *p = buf; |
| |
| /* Compare the pattern */ |
| for (i = 0; i < td->len; i++) { |
| if (p[i] != td->pattern[i]) |
| return -1; |
| } |
| return 0; |
| } |
| |
| /** |
| * create_bbt - [GENERIC] Create a bad block table by scanning the device |
| * @param mtd MTD device structure |
| * @param buf temporary buffer |
| * @param bd descriptor for the good/bad block search pattern |
| * @param chip create the table for a specific chip, -1 read all chips. |
| * Applies only if NAND_BBT_PERCHIP option is set |
| * |
| * Create a bad block table by scanning the device |
| * for the given good/bad block identify pattern |
| */ |
| static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip) |
| { |
| struct onenand_chip *this = mtd->priv; |
| struct bbm_info *bbm = this->bbm; |
| int i, j, numblocks, len, scanlen; |
| int startblock; |
| loff_t from; |
| size_t readlen, ooblen; |
| |
| printk(KERN_INFO "Scanning device for bad blocks\n"); |
| |
| len = 1; |
| |
| /* We need only read few bytes from the OOB area */ |
| scanlen = ooblen = 0; |
| readlen = bd->len; |
| |
| /* chip == -1 case only */ |
| /* Note that numblocks is 2 * (real numblocks) here; |
| * see i += 2 below as it makses shifting and masking less painful |
| */ |
| numblocks = mtd->size >> (bbm->bbt_erase_shift - 1); |
| startblock = 0; |
| from = 0; |
| |
| for (i = startblock; i < numblocks; ) { |
| int ret; |
| |
| for (j = 0; j < len; j++) { |
| size_t retlen; |
| |
| /* No need to read pages fully, |
| * just read required OOB bytes */ |
| ret = onenand_do_read_oob(mtd, from + j * mtd->writesize + bd->offs, |
| readlen, &retlen, &buf[0]); |
| |
| if (ret) |
| return ret; |
| |
| if (check_short_pattern(&buf[j * scanlen], scanlen, mtd->writesize, bd)) { |
| bbm->bbt[i >> 3] |= 0x03 << (i & 0x6); |
| printk(KERN_WARNING "Bad eraseblock %d at 0x%08x\n", |
| i >> 1, (unsigned int) from); |
| break; |
| } |
| } |
| i += 2; |
| from += (1 << bbm->bbt_erase_shift); |
| } |
| |
| return 0; |
| } |
| |
| |
| /** |
| * onenand_memory_bbt - [GENERIC] create a memory based bad block table |
| * @param mtd MTD device structure |
| * @param bd descriptor for the good/bad block search pattern |
| * |
| * The function creates a memory based bbt by scanning the device |
| * for manufacturer / software marked good / bad blocks |
| */ |
| static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd) |
| { |
| struct onenand_chip *this = mtd->priv; |
| |
| bd->options &= ~NAND_BBT_SCANEMPTY; |
| return create_bbt(mtd, this->page_buf, bd, -1); |
| } |
| |
| /** |
| * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad |
| * @param mtd MTD device structure |
| * @param offs offset in the device |
| * @param allowbbt allow access to bad block table region |
| */ |
| static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt) |
| { |
| struct onenand_chip *this = mtd->priv; |
| struct bbm_info *bbm = this->bbm; |
| int block; |
| uint8_t res; |
| |
| /* Get block number * 2 */ |
| block = (int) (offs >> (bbm->bbt_erase_shift - 1)); |
| res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03; |
| |
| DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n", |
| (unsigned int) offs, block >> 1, res); |
| |
| switch ((int) res) { |
| case 0x00: return 0; |
| case 0x01: return 1; |
| case 0x02: return allowbbt ? 0 : 1; |
| } |
| |
| return 1; |
| } |
| |
| /** |
| * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s) |
| * @param mtd MTD device structure |
| * @param bd descriptor for the good/bad block search pattern |
| * |
| * The function checks, if a bad block table(s) is/are already |
| * available. If not it scans the device for manufacturer |
| * marked good / bad blocks and writes the bad block table(s) to |
| * the selected place. |
| * |
| * The bad block table memory is allocated here. It must be freed |
| * by calling the onenand_free_bbt function. |
| * |
| */ |
| int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd) |
| { |
| struct onenand_chip *this = mtd->priv; |
| struct bbm_info *bbm = this->bbm; |
| int len, ret = 0; |
| |
| len = mtd->size >> (this->erase_shift + 2); |
| /* Allocate memory (2bit per block) */ |
| bbm->bbt = kmalloc(len, GFP_KERNEL); |
| if (!bbm->bbt) { |
| printk(KERN_ERR "onenand_scan_bbt: Out of memory\n"); |
| return -ENOMEM; |
| } |
| /* Clear the memory bad block table */ |
| memset(bbm->bbt, 0x00, len); |
| |
| /* Set the bad block position */ |
| bbm->badblockpos = ONENAND_BADBLOCK_POS; |
| |
| /* Set erase shift */ |
| bbm->bbt_erase_shift = this->erase_shift; |
| |
| if (!bbm->isbad_bbt) |
| bbm->isbad_bbt = onenand_isbad_bbt; |
| |
| /* Scan the device to build a memory based bad block table */ |
| if ((ret = onenand_memory_bbt(mtd, bd))) { |
| printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n"); |
| kfree(bbm->bbt); |
| bbm->bbt = NULL; |
| } |
| |
| return ret; |
| } |
| |
| /* |
| * Define some generic bad / good block scan pattern which are used |
| * while scanning a device for factory marked good / bad blocks. |
| */ |
| static uint8_t scan_ff_pattern[] = { 0xff, 0xff }; |
| |
| static struct nand_bbt_descr largepage_memorybased = { |
| .options = 0, |
| .offs = 0, |
| .len = 2, |
| .pattern = scan_ff_pattern, |
| }; |
| |
| /** |
| * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device |
| * @param mtd MTD device structure |
| * |
| * This function selects the default bad block table |
| * support for the device and calls the onenand_scan_bbt function |
| */ |
| int onenand_default_bbt(struct mtd_info *mtd) |
| { |
| struct onenand_chip *this = mtd->priv; |
| struct bbm_info *bbm; |
| |
| this->bbm = kmalloc(sizeof(struct bbm_info), GFP_KERNEL); |
| if (!this->bbm) |
| return -ENOMEM; |
| |
| bbm = this->bbm; |
| |
| memset(bbm, 0, sizeof(struct bbm_info)); |
| |
| /* 1KB page has same configuration as 2KB page */ |
| if (!bbm->badblock_pattern) |
| bbm->badblock_pattern = &largepage_memorybased; |
| |
| return onenand_scan_bbt(mtd, bbm->badblock_pattern); |
| } |
| |
| EXPORT_SYMBOL(onenand_scan_bbt); |
| EXPORT_SYMBOL(onenand_default_bbt); |